Application Notes

Compositional Depth Profile (CDP) using the LECO GDS950 rapidly provides analysis of various galvanized coatings on steel.

Analyze battery materials with precision using particle size and shape analysis alongside Raman spectroscopy to reveal structure, composition, and performance insights.

This note details a microwave digestion method for Li-ion cathode samples, enabling accurate elemental analysis through ICP-OES with minimal sample loss.

With intensifying global concerns surrounding water quality, explore the benefits of UV spectroscopy for water quality management, including real-time monitoring.

In this exclusive Spectroscopy interview, John Richmond and Tom Dearing of Thermo Fisher Scientific discuss the company’s Raman technology and the latest trends for process monitoring across various applications.

Quality assurance and quality control (QA/QC) are essential in pharmaceutical manufacturing to ensure compliance with standards like United States Pharmacopoeia <232> and ICH Q3D, as well as FDA regulations. Reliable and user-friendly testing solutions help QA/QC labs deliver precise trace elemental analyses while meeting throughput demands and data security requirements.

ICP-MS is the top choice for trace element analysis in bodily fluids. The NexION® 5000 ensures fast, precise detection in serum with simple sample prep.

USP and ICH Q3D set strict limits for elemental impurities in drugs. The NexION® 1100 ICP-MS ensures accurate, interference-free analysis of pharmaceutical products.

Controlling metal impurities in CO is vital for semiconductor fabrication. The NexION® 2200 ICP-MS with gas direct injection (GDI) enables faster, more sensitive analysis.

Trace impurities in tungsten hexacarbonyl must be measured precisely. The NexION® 1100 ICP-MS eliminates interferences, enabling accurate multi-element analysis.

ICP-MS is the go-to for detecting trace elements in bodily fluids. The NexION® 5000 makes urine analysis easy and precise with simple dilution—no digestion needed!

Ultra-pure NMP is essential in semiconductor fabrication. The NexION® 2200 ICP-MS enables precise, interference-free trace metal analysis, ensuring high-purity standards.

Si isotope analysis reveals insights into geological and biological processes. The NexION® 5000 ICP-MS offers high sensitivity, accuracy, and stability for precise ratio measurements.

Ultra-high-purity HCl is crucial in semicon wafer cleaning. The NexION® 2200 ICP-MS accurately quantifies ultra-trace impurities, minimizing interferences and sample prep.

The American Academy of Forensic Sciences (AAFS) Annual Scientific Meeting took place from February 17 to 22, 2025, in Baltimore, Maryland. In this video interview, we speak with Tom Metz of the Pacific Northwest National Laboratory, Heidi Eldridge of George Washington University, and Claire Glynn of the University of New Haven, all of whom attended AAFS this year and delivered important talks that provide insight into the state of the forensic science industry. Metz, Eldridge, and Glynn provide summaries of the talks they delivered at AAFS.

Discover how Hamamatsu Photonics’ CMOS image sensors are adapted to meet the evolving applications of water analysis, food inspection, and industrial position detection

Inductively coupled plasma optical emission spectrometry (ICP-OES) is the preferred technique for inorganic contaminant analysis of biodiesel, and PerkinElmer offers two technologies to support it. The Avio 220 Max and Avio 550 Max, combined with PerkinElmer's expertise, can help labs achieve accurate feedstock analysis demanded by today's market.

In BioTech R&D, overcoming data fragmentation is crucial as it hinders innovation, leads to redundant efforts, and wastes resources.

See how the NexION® 5000 multi-quad ICP-MS offers exceptional performance and interference removal for trace metallic impurities in ultra-pure N-methyl-2-pyrrolidone.

Camston Wrather is transforming waste disposal with sustainable resource recovery from PCBs. Partnering with PerkinElmer, they’ve advanced eco-friendly solutions.

For the analysis of semiconductor-grade solvents, see how the NexION® 2200 ICP-MS accurately quantifies ppt-level impurities by reducing polyatomic interferences.

In semiconductor fabrication, controlling impurities is crucial. This work describes metallic nanoparticle analysis in sulfuric acid using the NexION® 5000 SP-ICP-MS.

Explore a method for ultratrace-level quantification of nanoparticle impurities in semiconductor-grade TMAH using NexION® 5000 ICP-MS for improved yield and performance.

This work demonstrates the ability of the NexION® 2200 ICP-MS to reliably and effectively quantify ultra-trace impurities at the ng/L level in concentrated HCl.

For improved semiconductor gas analysis, discover how Gas Direct Injection-ICP-MS simplifies sample prep, replacing impingers with direct analysis.

For non-metallic impurity analysis in dilute nitric acid, the NexION® 5000 ICP-MS uses a mixed-mode method to achieve low-ppt detection, overcoming spectral interferences.

Analysis of drinking water in compliance with the U.S. EPA Method 200.8, Revision 5.4 using the Thermo Scientific iCAP MSX ICP-MS

Comprehensive analysis of water samples in alignment with EN ISO Method 17294 using ICP-MS

Robust analysis of a variety of water, wastewater, and soil samples according to the requirements of U.S. EPA Method 6020B.

This application note demonstrates robust and reliable analysis of soil samples using single quadrupole ICP-MS